Monitoring the formation of a CH3NH3PbI3-xClx perovskite during thermal annealing using X-ray scattering

Autor: Barrows, A.T., Lilliu, S., Pearson, A.J., Babonneau, D., Dunbar, A.D.F., Lidzey, D.G.
Jazyk: angličtina
Rok vydání: 2016
Zdroj: 'Advanced Functional Materials ', vol: 26, pages: 4934-4942 (2016)
ISSN: 1616-301X
Popis: Grazing incidence wide and small angle X-ray scattering (GIWAXS and GISAXS) measurements have been used to study the crystallization kinetics of the organolead halide perovskite CH3NH3PbI3-xClx during thermal annealing. In-situ GIWAXS measurements recorded during annealing are used to characterise and quantify the transition from a crystalline precursor to the perovskite structure. In-situ GISAXS measurements indicate an evolution of crystallite sizes during annealing, with the number of crystallites having sizes between 30 and 400 nm increasing through the annealing process. Using ex-situ scanning electron microscopy this evolution in length scales is confirmed and a concurrent increase in film surface coverage is observed, a parameter crucial for efficient solar cell performance. A series of photovoltaic devices are then fabricated in which perovskite films have been annealed for different times, and variations in device performance are explained on the basis of x-ray scattering measurements.
Databáze: OpenAIRE