Beam characterization of the orsay He-afterflow polarized electron source
| Autor: | Jöel Arianer, Ouasilla Zerhouni, Samuel Cohen, Robert Frascaria, Said Essabaa |
|---|---|
| Přispěvatelé: | Institut de Physique Nucléaire d'Orsay (IPNO), Université Paris-Sud - Paris 11 (UP11)-Institut National de Physique Nucléaire et de Physique des Particules du CNRS (IN2P3)-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 1997 |
| Předmět: |
010302 applied physics
Acoustics and Ultrasonics Chemistry Resolution (electron density) chemistry.chemical_element Condensed Matter Physics Electron source 01 natural sciences 010305 fluids & plasmas Surfaces Coatings and Films Electronic Optical and Magnetic Materials Characterization (materials science) Penning ionization 0103 physical sciences Physics::Accelerator Physics Thermal emittance [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det] Atomic physics Nuclear Experiment Beam energy Beam (structure) Helium |
| Zdroj: | Journal of Physics D: Applied Physics Journal of Physics D: Applied Physics, IOP Publishing, 1997, 30, pp.417-422 |
| ISSN: | 0022-3727 1361-6463 |
| Popis: | The measured optical properties of the Orsay polarized electron source, based on the ##IMG## [http://ej.iop.org/images/0022-3727/30/3/014/img1.gif] Penning ionization reaction are presented. The upper limit on the beam energy spread is 0.25 eV, corresponding to our experimental resolution. The highest normalized emittance obtained at low current ##IMG## [http://ej.iop.org/images/0022-3727/30/3/014/img2.gif] is ##IMG## [http://ej.iop.org/images/0022-3727/30/3/014/img3.gif] . The behaviour of these beam characteristics as a function of different relevant parameters is discussed. Journal of Physics D: Applied Physics |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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