From angle-resolved ellipsometry of light scattering to imaging in random media
| Autor: | Nora Le Neindre, Frédéric Chazallet, Myriam Zerrad, Gaëlle Georges, Laure Siozade, Laurent Arnaud, Carole Deumie, Claude Amra |
|---|---|
| Rok vydání: | 2008 |
| Předmět: |
Materials science
business.industry Scattering Materials Science (miscellaneous) Surface finish Signal Industrial and Manufacturing Engineering Light scattering symbols.namesake Optics Fourier transform Stack (abstract data type) Ellipsometry symbols Business and International Management business Refractive index |
| Zdroj: | Applied optics. 47(13) |
| ISSN: | 1559-128X |
| Popis: | A procedure is described to allow selective cancellation of polarized scattering within optical substrates and multilayers. It is shown how bulk scattering (respectively surface) can be directly eliminated while the remaining roughness (respectively bulk) signal is still measurable. The same procedure can be applied to isolate a single interface or bulk within a stack or to detect slight departure from perfect correlation within multilayers. Experiments and a procedure for selective imaging in random media are described. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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