Imaging individual atoms inside crystals with ADF-STEM
| Autor: | David A. Muller, J.L. Grazul, Paul M. Voyles |
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| Rok vydání: | 2003 |
| Předmět: |
Dopant
business.industry Chemistry Polishing Image processing Dark field microscopy Molecular physics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Amorphous solid Optics Impurity Scanning transmission electron microscopy Surface roughness business Instrumentation |
| Zdroj: | Ultramicroscopy. 96:251-273 |
| ISSN: | 0304-3991 |
| Popis: | The quantitative imaging of individual impurity atoms in annular dark-field scanning transmission electron microscopy (ADF-STEM) requires a clear theoretical understanding of ADF-STEM lattice imaging, nearly ideal thin samples, and careful attention to image processing. We explore the theory using plane-wave multislice simulations that show the image intensity of substitutional impurities is depth-dependent due to probe channeling, but the intensity of interstitial impurities need not be. The images are only directly interpretable in thin samples. For this reason, we describe a wedge mechanical polishing technique to produce samples less than |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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