Position determination and resolution of two-dimensional position-sensitive solid-state detectors

Autor:	G.V. Margagliotti, E. Fuschini, L. Manduci, G. Vannini, P. Buttazzo, M. Bruno, P. M. Milazzo, F. Gramegna, R. Scardaoni, M. D'Agostino, A. Moroni, S. Ostuni, I. Iori, M. L. Fiandri
Přispěvatelé:	M., Bruno, M., D'Agostino, M. L., Fiandri, E., Fuschini, P. M., Milazzo, S., Ostuni, F., Gramegna, I., Iori, L., Manduci, A., Moroni, R., Scardaoni, P., Buttazzo, Margagliotti, Giacomo, G., Vannini
Rok vydání:	1992
Předmět:	Physics Nuclear and High Energy Physics Resistive touchscreen Physics::Instrumentation and Detectors business.industry Detector Particle detector Semiconductor detector Ion Position Sensitive Silicon Detectors Optics Position (vector) Measuring instrument business Instrumentation Image resolution
Zdroj:	Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 311:189-194
ISSN:	0168-9002
Popis:	The determination of the coordinates of the incidence position on large solid state detectors, where the position sensitiveness is due to resistive electrodes, is discussed. A method to extract the x and y values from the signals at the corners of the resistive layer is described and tested. The results have been checked with different detectors and a variety of energies and ion beams.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fdc393b6c1c92672185032e659a81384 https://doi.org/10.1016/0168-9002(92)90865-2 Zobrazit plný text záznamu