Rotational invariants for polarized Raman spectroscopy
| Autor: | D. B. Chase, Simon Frisk, John F. Rabolt, Richard M. Ikeda |
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| Rok vydání: | 2003 |
| Předmět: |
Models
Molecular Infrared Analytical chemistry Molecular Conformation Infrared spectroscopy Spectrum Analysis Raman 01 natural sciences Molecular physics 010309 optics Absorbance symbols.namesake 0103 physical sciences Spectroscopy Fourier Transform Infrared Computer Simulation Coherent anti-Stokes Raman spectroscopy Spectroscopy Instrumentation Chemistry Polyethylene Terephthalates 010401 analytical chemistry 0104 chemical sciences X-ray crystallography symbols Anisotropy Microscopy Polarization Raman spectroscopy Crystallization Raman scattering Algorithms |
| Zdroj: | Applied spectroscopy. 57(9) |
| ISSN: | 0003-7028 |
| Popis: | A new method has been developed to determine an orientation-independent Raman scattered intensity based on various polarized Raman measurements. The equivalent term in infrared spectroscopy is the structural absorbance, which has existed for many years. As with the structural absorbance, the calculated Raman intensity allows one to observe spectral changes that are due uniquely to morphological changes in a set of different samples in the presence of orientation differences. The full theoretical development is presented, followed by an example based on a set of polymer fibers processed under different conditions leading to different morphologies and degrees of molecular orientation. |
| Databáze: | OpenAIRE |
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