Diagnostics for ultrashort X-ray pulses using silicon trackers
| Autor: | Zongqing Zhao, Jirong Cang, Ming Zeng, Y. M. Zhang, Wenbo Mo, Yang Yue, Bo Zhang, Minghai Yu, Ge Ma, Jiaxing Wen, Yuchi Wu |
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| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Physics
Nuclear and High Energy Physics Physics - Instrumentation and Detectors business.industry Scattering Physics::Instrumentation and Detectors Astrophysics::High Energy Astrophysical Phenomena Resolution (electron density) Detector Compton scattering FOS: Physical sciences Instrumentation and Detectors (physics.ins-det) Plasma Electron Dot pitch Optics Depletion region business Instrumentation |
| Popis: | The spectrum of laser-plasma generated X-rays is very important, it characterizes electron dynamics in plasma and is basic for applications. However, the accuracies and efficiencies of existing methods to diagnose the spectrum of laser-plasma based X-ray pulse are not very high, especially in the range of several hundred keV. In this study, a new method based on electron tracks detection to measure the spectrum of laser-plasma produced X-ray pulses is proposed and demonstrated. Laser-plasma generated X-rays are scattered in a multi-pixel silicon tracker. Energies and scattering directions of Compton electrons can be extracted from the response of the detector, and then the spectrum of X-rays can be reconstructed. Simulations indicate that the energy resolution of this method is approximately 20% for X-rays from 200 to 550 keV for a silicon-on-insulator pixel detector with 12 $\rm \mu$m pixel pitch and 500 $\rm \mu$m depletion region thickness. The results of a proof-of-principle experiment based on a Timepix3 detector are also shown. Comment: final manuscript, 30 pages, 17 figures, published on NIM-A |
| Databáze: | OpenAIRE |
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