XRMA and ToF-SIMS Analysis of Normal and Hypomineralized Enamel
| Autor: | Fabian Taube, David H. Cornell, Jesper Lundgren, Lisa Melin, Per Malmberg, Jörgen G. Norén |
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| Rok vydání: | 2015 |
| Předmět: |
Sweden
Minerals Dental Enamel Hypoplasia Materials science Enamel paint Hypomineralized enamel Analytical chemistry Spectrometry Mass Secondary Ion Molar Incisor Hypomineralization Microanalysis Mandibular first molar Secondary ion mass spectrometry stomatognathic diseases stomatognathic system visual_art visual_art.visual_art_medium Humans Child Dental Enamel Ameloblast Instrumentation Electron Probe Microanalysis |
| Zdroj: | Microscopy and Microanalysis. 21:407-421 |
| ISSN: | 1435-8115 1431-9276 |
| Popis: | Molar incisor hypomineralization (MIH) is a developmental disturbance of the enamel. This study presents analyses of hypomineralized and normal enamel in first molar teeth diagnosed with MIH, utilizing time-of-flight secondary ion mass spectrometry area analyses and X-ray microanalysis of area and spot profiles in uncoated samples between gold lines which provide electrical conductivity. Statistical analysis of mean values allows discrimination of normal from MIH enamel, which has higher Mg and lower Na and P. Inductive analysis using complete data sets for profiles from the enamel surface to the enamel–dentin junction found that Mg, Cl and position in the profile provide useful discrimination criteria. Element profiles provide a visual complement to the inductive analysis and several elements also provide insight into the development of both normal and MIH enamel. The higher Mg content and different Cl profiles of hypomineralized enamel compared with normal enamel are probably related to a relatively short period during the development of ameloblasts between birth and the 1st year of life. |
| Databáze: | OpenAIRE |
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