GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse
| Autor: | Chiocchetta, F., De Santi, C., Rampazzo, F., Mukherjee, K., Grunenputt, J., Sommer, D., Blanck, H., Lambert, B., Gerosa, A., Meneghesso, G., Zanoni, E., Meneghini, M. |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE International Reliability Physics Symposium (IRPS) |
| DOI: | 10.1109/irps48227.2022.9764510 |
| Databáze: | OpenAIRE |
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