An electron energy loss spectrometer based streak camera for time resolved TEM measurements
| Autor: | Jim Ögren, Hasan Ali, Johan Eriksson, S. Kumar, Klaus Leifer, Volker Ziemann, S. Hassan M. Jafri, Hu Li |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Physics Electron energy Spectrometer business.industry Streak camera ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Filter (large eddy simulation) Optics Transmission electron microscopy 0103 physical sciences 0210 nano-technology business Instrumentation Energy (signal processing) |
| Zdroj: | Ultramicroscopy. 176 |
| ISSN: | 1879-2723 |
| Popis: | We propose an experimental setup based on a streak camera approach inside an energy filter to measure time resolved properties of materials in the transmission electron microscope (TEM). In order to put in place the streak camera, a beam sweeper was built inside an energy filter. After exciting the TEM sample, the beam is swept across the CCD camera of the filter. We describe different parts of the setup at the example of a magnetic measurement. This setup is capable to acquire time resolved diffraction patterns, electron energy loss spectra (EELS) and images with total streaking times in the range between 100ns and 10μs. |
| Databáze: | OpenAIRE |
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