Stress state in the vicinity of an inclined elliptical defect and stress intensity factors for biaxial loading of a plate
Autor: | P. B. Utkin, A. A. Ostsemin |
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Rok vydání: | 2009 |
Předmět: |
Cracks
Materials science Holography Asphalt pavements Mechanics Ellipse Holographic interferometry Stress (mechanics) Fracture mechanics Stresses Bi-axial loadings Inclined cracks Strength of materials Experimental datum Stress intensity factor Interferometers Mechanical Engineering Plate with an inclined elliptical notch Stress intensity factors State (functional analysis) Condensed Matter Physics Interferometry Mechanics of Materials Stress state Vertex (curve) Kolosov-Muskhelishvili method |
Zdroj: | Journal of Applied Mechanics and Technical Physics. 50:99-106 |
ISSN: | 1573-8620 0021-8944 |
DOI: | 10.1007/s10808-009-0014-1 |
Popis: | The problem of determining the stress state of a plate with an inclined elliptical notch under biaxial loading is considered. The Kolosov-Muskhelishvili method is used to obtain an expression for the stress near the vertex of an inclined ellipse, whose particular case are expressions for the stress in the case of an inclined crack. The stress intensity factors K I and K II were determined experimentally by holographic interferometry in the case of extension of a plate with an inclined crack-like defect. The calculation results are compared with experimental data. © MAIK/Nauka 2009. |
Databáze: | OpenAIRE |
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