Pepperpot emittance measurements of ion beams from an electron beam ion source
| Autor: | S. Duarte Pinto, Hannes Pahl, Andrey Shornikov, A. Pikin, F. Wenander, J. Pitters, M. Breitenfeldt |
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| Rok vydání: | 2019 |
| Předmět: |
Physics
Nuclear and High Energy Physics business.industry Detector 01 natural sciences Signal Ion source 010305 fluids & plasmas Ion Optics Duty cycle 0103 physical sciences Cathode ray Physics::Accelerator Physics Microchannel plate detector Thermal emittance Detectors and Experimental Techniques 010306 general physics business Instrumentation |
| Zdroj: | Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
| ISSN: | 0168-9002 |
| DOI: | 10.1016/j.nima.2018.12.072 |
| Popis: | A pepperpot emittance meter was used to measure the transverse emittance of multiply charged beams from REXEBIS, an Electron Beam Ion Source (EBIS) used for charge breeding of radioactive ion beams. The emittance meter is equipped with a Micro Channel Plate (MCP), a phosphor screen and a CCD camera for detection of the ion signal. The pulsed beam structure of low duty cycle imposes challenging constraints on the detector settings. In this article we give a careful analysis of the optimal operating parameters of the pepperpot emittance meter for ion beams of varying intensities. Emittance values for mass-separated and non-separated beams for different operating modes of the EBIS are presented. Furthermore we report on aberrations created in our injection ∕ extraction system. |
| Databáze: | OpenAIRE |
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