Extraction of optical constants from maxima of fringing reflectance spectra
| Autor: | Shun-Tung Yen, Pei Kang Chung |
|---|---|
| Rok vydání: | 2015 |
| Předmět: |
Materials science
Oscillation business.industry Physics::Optics Dielectric Molar absorptivity Atomic and Molecular Physics and Optics Spectral line Condensed Matter::Materials Science Optics Electrical and Electronic Engineering Reflection coefficient business Engineering (miscellaneous) Refractive index Fabry–Pérot interferometer Envelope (waves) |
| Zdroj: | Applied Optics. 54:663 |
| ISSN: | 2155-3165 1559-128X |
| DOI: | 10.1364/ao.54.000663 |
| Popis: | We propose a scheme to extract the refractive index and the extinction coefficient of dielectrics. The extraction needs only a reflectance spectrum with reliable successive maxima of fringing oscillations measured from a dielectric film that is either freestanding or on metal. With the film thickness known in advance, we determine the refractive index spectrum from the fringing oscillation periods and then the extinction coefficient spectrum from the upper envelope. The method is demonstrated to work well for GaAs and Ge. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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