Theoretical and experimental studies of off-the-shelf V-dot probes
| Autor: | M. Rivaletto, T Tom Huiskamp, Peter Senior, Bucur M. Novac, A.J.M. Pemen, Renzhen Xiao, Laurent Pecastaing, Meng Wang, Antoine Silvestre de Ferron |
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| Přispěvatelé: | Laboratoire des Sciences de l'Ingénieur Appliquées à la Mécanique et au génie Electrique (SIAME), Université de Pau et des Pays de l'Adour (UPPA), Electrical Energy Systems, Cyber-Physical Systems Center Eindhoven, Power Conversion |
| Jazyk: | angličtina |
| Rok vydání: | 2018 |
| Předmět: |
Nuclear and High Energy Physics
Microwave integrated circuits Measure (physics) voltage probes 01 natural sciences 010305 fluids & plasmas Generator (circuit theory) Transmission line measurements Optics 0103 physical sciences Off the shelf Closing (morphology) Coaxial transmission line [PHYS]Physics [physics] Physics Pulse forming lines (PFLs) 010308 nuclear & particles physics business.industry pulsed-power systems Voltage measurement Spark gap Nanosecond Condensed Matter Physics Microwave FET integrated circuits Spark gaps Probes business Connectors Voltage |
| Zdroj: | IEEE Transactions on Plasma Science IEEE Transactions on Plasma Science, Institute of Electrical and Electronics Engineers, 2018, 46 (8), pp.2985-2992. ⟨10.1109/TPS.2018.2854971⟩ IEEE Transactions on Plasma Science, 46(8):8419077, 2985-2992. Institute of Electrical and Electronics Engineers |
| ISSN: | 0093-3813 |
| DOI: | 10.1109/tps.2018.2854971 |
| Popis: | International audience; This paper introduces the work undertaken to reliably use off-the-shelf differentiating voltage probes attached to coaxial transmission lines. The results obtained prove that indeed such probes are a valid and simple instrument for measuring nanosecond and subnanosecond voltage impulses. As a bonus, this paper also highlighted an important challenging phenomenon that appears whenever an attempt is made to measure fast voltage impulses with a differentiating probe positioned too close to the closing switch of a pulse forming line generator. \textcopyright 1973-2012 IEEE. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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