Oscillatory behaviour of the interlayer coupling with the thickness of the Cu cap layer in Co/Cu(100)

Autor:	J.J. de Vries, RM Jungblut, A.A.P. Schudelaro, W. J. M. de Jonge
Rok vydání:	1996
Předmět:	Reflection (mathematics) Materials science Quantitative Biology::Neurons and Cognition Condensed matter physics Antiferromagnetism Coupling (piping) Condensed Matter Physics Layer thickness Layer (electronics) Electronic Optical and Magnetic Materials
Zdroj:	Journal of Magnetism and Magnetic Materials. 156:257-258
ISSN:	0304-8853
Popis:	The dependence of the exchange coupling on the thickness of the Cu cap layer in a double wedged MBE grown Co/Cu(100) sample has been studied. The strength of four antiferromagnetic maxima oscillates with the cap layer thickness, consistent with Bruno's reflection model. From this model the relative phases of the oscillations can also be explained.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9182eb18bb87e4685b9cf876a2fc7a6 https://doi.org/10.1016/0304-8853(95)00859-4 Zobrazit plný text záznamu Full Text from ScienceDirect