Optical properties of carbon nanotube thin films in subterahertz frequency regime
| Autor: | Guillaume Ducournau, Horacio Lamela Rivera, V. K. T. Vinod, Jean-Francois Lampin, Ehsan Dadrasnia, Sujitha Puthukodan |
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| Přispěvatelé: | Optoelectronics and Laser Technology Group (GOTL), University Carlos III de Madrid, Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), This work was supported by the project MITEPHO (MIcrowave and TErahertz PHOtonics, ITN-FP7, 238393) under the European Commission, which seeks to investigate and develop compact and integrated tunable dual-mode diode lasers for THz spectroscopy in sensing, nanotechnology, and biomedical applications. |
| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: |
Nanotube
Materials science 02 engineering and technology 7. Clean energy 01 natural sciences law.invention Optics law 0103 physical sciences absorption coefficient Electrical and Electronic Engineering Thin film Absorption (electromagnetic radiation) 010302 applied physics Fused quartz refractive index carbon nanotubes business.industry vector network analyzer 021001 nanoscience & nanotechnology Condensed Matter Physics continuous wave terahertz measurement Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Attenuation coefficient Continuous wave 0210 nano-technology business Refractive index Microwave |
| Zdroj: | Microwave and Optical Technology Letters Microwave and Optical Technology Letters, Wiley, 2014, 56, pp.1895-1898. ⟨10.1002/mop.28477⟩ Microwave and Optical Technology Letters, 2014, 56, pp.1895-1898. ⟨10.1002/mop.28477⟩ |
| ISSN: | 0895-2477 1098-2760 |
| Popis: | Multiwalled carbon nanotube (MWCNT) thin films deposited on fused quartz substrates are characterized by continuous wave subterahertz free space technique using a vector network analyzer (VNA). The scattering (S) parameters are measured by a VNA in the frequency range of 220–325 GHz (G-band) and 325–500 GHz (Y-band). The complex refractive index is extracted with the help of Nicholson–Ross–Weir method. The transmission and absorption of the thin films are also studied. VNA offers a good spectral resolution and a dynamic range of 60–70 dB around 500 GHz. The experimental technique and material parameter extraction procedures are described. The refractive index, transmission and absorption coefficient obtained for MWCNT thin films are plotted and the results are discussed. © 2014 Wiley Periodicals, Inc. Microwave Opt Technol Lett 56:1895–1898, 2014 |
| Databáze: | OpenAIRE |
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