Sub-THz characterisation of multi-walled carbon nanotube thin films using vector network analyser

Autor: J-F. Lampin, Jean-Louis Coutaz, Ehsan Dadrasnia, Seunghyun Baik, H.K. Nguendon, Dongmok Lee, Frédéric Garet, V. K. T. Vinod, Sujitha Puthukodan, Guillaume Ducournau, Horacio Lamela
Přispěvatelé: GOTL, Universidad Carlos III de Madrid [Madrid] (UC3M), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), School of Mechanical Engineering, Sungkyunkwan University [Suwon] (SKKU), This work was supported by the project MITEPHO (MIcrowave and TErahertz PHOtonics, ITN-FP7, 238393) under the European Commission, which seeks to investigate and develop compact and integrated tunable dual-mode diode lasers for THz spectroscopy in sensing, nanotechnology and biomedical applications. We also acknowledge the World Class University Program (R31-2008- 000-10029-0) funded by the Ministry of Education, Science and Technology, Korea.
Jazyk: angličtina
Rok vydání: 2014
Předmět:
Zdroj: Electronics Letters
Electronics Letters, IET, 2014, 50, pp.297-299. ⟨10.1049/el.2013.4136⟩
Electronics Letters, 2014, 50, pp.297-299. ⟨10.1049/el.2013.4136⟩
ISSN: 0013-5194
1350-911X
Popis: A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.
Databáze: OpenAIRE
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