Significant softening of copper nanowires during electromigration studied by picosecond ultrasound spectroscopy

Autor:	Masahiko Hirao, K. Nakano, Hirotsugu Ogi, Kouta Kondou, Nobutomo Nakamura, Teruo Ono, A. Yamamoto, Ken-ichi Morita
Rok vydání:	2010
Předmět:	Materials science Condensed matter physics Vacancy defect Picosecond Nanowire Resonance Grain boundary Condensed Matter Physics Spectroscopy Ultrashort pulse Electromigration Electronic Optical and Magnetic Materials
Zdroj:	Physical Review B. 82
ISSN:	1550-235X 1098-0121
DOI:	10.1103/physrevb.82.155436
Popis:	Ogi H., Yamamoto A., Kondou K., et al. "Significant softening of copper nanowires during electromigration studied by picosecond ultrasound spectroscopy", Physical Review B - Condensed Matter and Materials Physics, 82(15), 155436, 2010. https://doi.org/10.1103/PhysRevB.82.155436. High-frequency vibrations related with copper nanowires on a silicon substrate are studied using picosecond ultrasound spectroscopy. The reflectivity change in the probe light pulse is monitored after irradiation of the specimen with the ultrafast light pulse, showing high (∼75 GHz) and low (
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f80fa34523792e310277ad3e4fcc05ba https://doi.org/10.1103/physrevb.82.155436 Zobrazit plný text záznamu