In situ transmission electron microscope formation of a single-crystalline Bi film on an amorphous substrate
| Autor: | M. Neklyudova, Henny W. Zandbergen, Carlos Sabater, J. M. van Ruitenbeek, A. K. Erdamar |
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| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: |
Materials science
Physics and Astronomy (miscellaneous) business.industry chemistry.chemical_element 02 engineering and technology Substrate (electronics) 021001 nanoscience & nanotechnology 01 natural sciences Amorphous solid Bismuth Optics chemistry Transmission electron microscopy 0103 physical sciences Cathode ray Crystallite Dewetting Composite material 010306 general physics 0210 nano-technology business Layer (electronics) |
| Zdroj: | Applied Physics Letters, 110(10), 103101 Applied Physics Letters, 110(10) |
| ISSN: | 0003-6951 |
| Popis: | We have performed a range of in situ heating experiments of polycrystalline Bi films of 22-25 nm-thickness in a transmission electron microscope (TEM). This shows that it is possible to locally transform a polycrystalline thin film into a [111]-oriented single-crystalline film, whereby the unique feature is that the original thickness of the film is maintained, and the substrate used in our experiments is amorphous. The single-crystalline areas have been created by heating the Bi film to temperatures close to the melting temperature with additional heating by focusing of the electron beam (e-beam), which results in local melting of the film. The film does not collapse by dewetting, and upon subsequent cooling, the film transforms into a single-crystalline [111] oriented area. The observed phenomenon is attributed to the presence of a thin Bi-oxide layer on top of Bi film. We show that removal of the Bi-oxide layer by heating the film in a H2 gas atmosphere results in changes in the Bi film thickness and dewetting upon in situ heating in the TEM. |
| Databáze: | OpenAIRE |
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