| Autor: |
Vayshenker, I., Livigni, D. J., Li, X., Lehman, J. H., Li, J., Xiong, L. M., Zhang, Z. X. |
| Rok vydání: |
2010 |
| Předmět: |
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| Zdroj: |
Journal of Research of the National Institute of Standards and Technology |
| ISSN: |
1044-677X |
| DOI: |
10.6028/jres.115.029 |
| Popis: |
We describe the results of a comparison of reference standards between the National Institute of Standards and Technology (NIST-USA) and National Institute of Metrology (NIM-China). We report optical fiber-based power measurements at nominal wavelengths of 1310 nm and 1550 nm. We compare the laboratories' reference standards by means of a commercial optical power meter. Measurement results showed the largest difference of less than 2.6 parts in 10(3), which is within the combined standard (k = 1) uncertainty for the laboratories' reference standards. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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