Interface dilution and morphology of CdTe/MnTe superlattices studied by small angle X-ray scattering
| Autor: | Jean-Michel Hartmann, G. T. Baumbach, Joël Eymery |
|---|---|
| Přispěvatelé: | Service de Physique des Matériaux et Microstructures (SP2M - UMR 9002), Institut Nanosciences et Cryogénie (INAC), Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), European Synchrotron Radiation Facility (ESRF), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019]) |
| Jazyk: | angličtina |
| Rok vydání: | 1998 |
| Předmět: |
Superlattice
Interfaces Analytical chemistry 02 engineering and technology Surface finish 01 natural sciences Inorganic Chemistry Optics 0103 physical sciences Materials Chemistry Born approximation CdTe/MnTe superlattices 010302 applied physics business.industry Small-angle X-ray scattering Chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics Microstructure Cadmium telluride photovoltaics Small angle X-ray diffraction [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] Small-angle scattering 0210 nano-technology business Refractive index |
| Zdroj: | Journal of Crystal Growth Journal of Crystal Growth, Elsevier, 1998, 184-185, pp.109-113. ⟨10.1016/S0022-0248(98)80304-7⟩ Journal of Crystal Growth, 1998, 184-185, pp.109-113. ⟨10.1016/S0022-0248(98)80304-7⟩ |
| ISSN: | 0022-0248 |
| Popis: | International audience; We have performed small angle X-ray reflectivity measurements on CdTe/MnTe superlattices. The Fresnel optical method and the distorted wave Born approximation were used to extract results from the data. The reflectivity shows that the interface roughness (about 7 Å) is quite large for (43 ML CdTe/8 ML MnTe) and (34 ML CdTe/16 ML MnTe) samples. The effective MnTe concentration is determined from the refractive index. A model of correlated interface profiles is successfully used to simulate the diffuse scattering, and to determine the lateral correlation length of the roughness (Λ| = 1500 ± 750 Å); moreover, we demonstrate that the layers are almost completely correlated over the sample thickness in the growth direction. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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