Investigations into the impact of various substrates and ZnO ultra thin seed layers prepared by atomic layer deposition on growth of ZnO nanowire array
| Autor: | CB Tan, YB Liu, Ningyi Yuan, Jianning Ding |
|---|---|
| Jazyk: | angličtina |
| Předmět: |
Materials science
business.industry Scanning electron microscope Seed layers Nano Idea Nanowire Nanochemistry Nanotechnology Substrate (electronics) Surface finish Condensed Matter Physics Frequency of roughness Indium tin oxide Atomic layer deposition Materials Science(all) ZnO Optoelectronics General Materials Science Texture (crystalline) The fluctuate amplitude business |
| Zdroj: | Nanoscale Research Letters |
| ISSN: | 1556-276X |
| DOI: | 10.1186/1556-276x-7-368 |
| Popis: | The impact of various substrates and zinc oxide (ZnO) ultra thin seed layers prepared by atomic layer deposition on the geometric morphology of subsequent ZnO nanowire arrays (NWs) fabricated by the hydrothermal method was investigated. The investigated substrates included B-doped ZnO films, indium tin oxide films, single crystal silicon (111), and glass sheets. Scanning electron microscopy and X-ray diffraction measurements revealed that the geometry and aligment of the NWs were controlled by surface topography of the substrates and thickness of the ZnO seed layers, respectively. According to atomic force microscopy data, we suggest that the substrate, fluctuate amplitude and fluctuate frequency of roughness on ZnO seed layers have a great impact on the alignment of the resulting NWs, whereas the influence of the seed layers' texture was negligible. |
| Databáze: | OpenAIRE |
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