Antireflection effects at nanostructured material interfaces and the suppression of thin-film interference
| Autor: | Wei Guo, Abhijeet Bagal, Chih-Hao Chang, Qiaoyin Yang, Xu A. Zhang |
|---|---|
| Rok vydání: | 2013 |
| Předmět: |
Silicon
Work (thermodynamics) Nanostructure Materials science Fabrication Optical Phenomena genetic structures Polymers business.industry Mechanical Engineering Bioengineering General Chemistry Interference (wave propagation) Nanostructures Wavelength Optics Mechanics of Materials Thin-film interference Animals General Materials Science sense organs Sensitivity (control systems) Electrical and Electronic Engineering Thin film business |
| Zdroj: | Nanotechnology. 24:235202 |
| ISSN: | 1361-6528 0957-4484 |
| DOI: | 10.1088/0957-4484/24/23/235202 |
| Popis: | Thin-film interference is a well-known effect, and it is commonly observed in the colored appearance of many natural phenomena. Caused by the interference of light reflected from the interfaces of thin material layers, such interference effects can lead to wavelength and angle-selective behavior in thin-film devices. In this work, we describe the use of interfacial nanostructures to eliminate interference effects in thin films. Using the same principle inspired by moth-eye structures, this approach creates an effective medium where the index is gradually varying between the neighboring materials. We present the fabrication process for such nanostructures at a polymer-silicon interface, and experimentally demonstrate its effectiveness in suppressing thin-film interference. The principle demonstrated in this work can lead to enhanced efficiency and reduce wavelength/angle sensitivity in multilayer optoelectronic devices. |
| Databáze: | OpenAIRE |
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