Barrier thickness dependence of the magnetoresistance in TaOx magnetic tunnel junctions

Autor:	R Reinder Coehoorn, Php Paul Koller, de Wjm Wim Jonge
Přispěvatelé:	Physics of Nanostructures, Molecular Materials and Nanosystems
Rok vydání:	2005
Předmět:	Thickness dependent Materials science Condensed matter physics Magnetoresistance Spin polarization Photoconductivity media_common.quotation_subject General Physics and Astronomy Asymmetry Spectral line Ferromagnetism sense organs Oxidation rate media_common
Zdroj:	Journal of Applied Physics, 97(8):083913, 083913-1/4. American Institute of Physics
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.1872199
Popis:	A systematic study has been conducted on the dependence of the magnetoresistance (MR) ratio on the barrier thickness in TaOx-based magnetic tunnel junctions. The relatively low MR ratio (
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5b72a8b68913c51a1c6d5cc3354de27 https://doi.org/10.1063/1.1872199 Zobrazit plný text záznamu