Silicon drift detector based X-ray spectroscopy diagnostic system for the study of non-thermal electrons at Aditya tokamak

Autor:	J. V. Raval, R. Tanna, Jaya Ghosh, S. B. Bhatt, Y. S. Joisa, B. K. Shukla, Shishir Purohit
Rok vydání:	2014
Předmět:	Physics Tokamak Spectrometer Silicon drift detector business.industry Plasma Electron ADITYA Electron cyclotron resonance law.invention Optics Physics::Plasma Physics law Electron temperature Atomic physics business Instrumentation
Zdroj:	The Review of scientific instruments. 85(11)
ISSN:	1089-7623
Popis:	Silicon drift detector based X-ray spectrometer diagnostic was developed to study the non-thermal electron for Aditya tokamak plasma. The diagnostic was mounted on a radial mid plane port at the Aditya. The objective of diagnostic includes the estimation of the non-thermal electron temperature for the ohmically heated plasma. Bi-Maxwellian plasma model was adopted for the temperature estimation. Along with that the study of high Z impurity line radiation from the ECR pre-ionization experiments was also aimed. The performance and first experimental results from the new X-ray spectrometer system are presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5a744a878b28166ca79e5f82857fc7b https://pubmed.ncbi.nlm.nih.gov/25430326 Zobrazit plný text záznamu