Characterization of sizing layers and buried polymer/sizing/substrate interfacial regions using a localized fluorescent probe
| Autor: | John H. van Zanten, Joseph L. Lenhart, Richard S. Parnas, Joy P. Dunkers |
|---|---|
| Rok vydání: | 2003 |
| Předmět: |
Thermogravimetric analysis
Hot Temperature Materials science Polymers Scanning electron microscope Fluorescence spectrometry Analytical chemistry Thermosetting polymer Biomaterials Contact angle chemistry.chemical_compound Colloid and Surface Chemistry Surface Tension Benzhydryl Compounds Composite material Fluorescent Dyes chemistry.chemical_classification Epoxy Resins Epoxy Polymer Silanes Silicon Dioxide Silane Surfaces Coatings and Films Electronic Optical and Magnetic Materials Spectrometry Fluorescence chemistry Propylene Glycols Spectrophotometry visual_art Microscopy Electron Scanning visual_art.visual_art_medium Epoxy Compounds Glass Ethers |
| Zdroj: | Journal of Colloid and Interface Science. 257:398-407 |
| ISSN: | 0021-9797 |
| DOI: | 10.1016/s0021-9797(02)00035-8 |
| Popis: | A novel technique is described to investigate buried polymer/sizing/substrate interfacial regions, in situ, by localizing a fluorescent probe molecule in the sizing layer. Epoxy functional silane coupling agent multilayers were deposited on glass microscope cover slips and doped with small levels of a fluorescently labeled silane coupling agent (FLSCA). The emission of the grafted FLSCA was dependent on the silane layer thickness, showing blue-shifted emission with decreasing thickness. The fluorescent results suggest that thinner layers were more tightly bound to the glass surface. The layers were also characterized by scanning electron microscopy, contact angle, and thermogravimetric analysis (TGA). When the FLSCA-doped silane layers were immersed in epoxy resin, a blue shift in emission occurred during resin cure, indicating the potential to study interfacial chemistry, in situ. Thicker silane layers exhibited smaller fluorescence shifts during cure, suggesting incomplete resin penetration into the thickest silane layers. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect