High critical current density obtained by focused ion beam patterning of high temperature superconducting thin films
| Autor: | Isabelle Zaquine, G. Ben Assayag, Jacques Gierak, M. Mercandalli, B. Marcilhac, J. C. Mage, B. Dessertenne |
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| Přispěvatelé: | Thomson-CSF Laboratoire Central de Recherches (THOMSON-CSF LCR), Thomson, France Telecom, Centre National d'Etudes de Télécommunications, Laboratoire de Bagneux (CNET Bagneux), CNET |
| Rok vydání: | 1992 |
| Předmět: |
010302 applied physics
Superconductivity [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] High-temperature superconductivity Condensed matter physics Chemistry General Physics and Astronomy 01 natural sciences Focused ion beam law.invention Electrical resistivity and conductivity law Etching 0103 physical sciences Thin film Ion milling machine Current (fluid) 010306 general physics ComputingMilieux_MISCELLANEOUS |
| Zdroj: | Journal of Applied Physics Journal of Applied Physics, American Institute of Physics, 1992, 72 (1), pp.270-272. ⟨10.1063/1.352126⟩ |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.352126 |
| Popis: | In an attempt to pattern microbridges in a superconducting line by focused ion beam milling, we have obtained a very high critical current density: 6 × 108 A/cm2 at 77 K. Direct focused ion milling leads to microbridge structures as narrow as 200 nm. Ultrahigh current densities have already been reported by H. Jiang [Phys. Rev. Lett. 66, 1785 (1991)] in such ‘‘nanobridges.’’ We have also measured size‐dependent critical current densities. We take into account the electrical field criterion and give a very simple interpretation of our experimental results based on the possibility of strong pinning in a very narrow bridge and the inhomogeneity of our films at a submicronic scale. |
| Databáze: | OpenAIRE |
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