LaFeOxNy perovskite thin films: Nitrogen location and its effect on morphological, optical and structural properties
| Autor: | Patrice Miska, Sébastien Diliberto, Erwan André, Emile Haye, Frans Munnik, Romain Coustel, Silvère Barrat, Cédric Carteret, Christine Gendarme, Pascal Boulet, Fabien Capon, Sylvie Migot, Stéphanie Bruyère |
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| Přispěvatelé: | Institut Jean Lamour (IJL), Université de Lorraine (UL)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Laboratoire Interdisciplinaire de Spectroscopie Electronique (LISE), Facultés Universitaires Notre Dame de la Paix (FUNDP), Laboratoire de Chimie Physique et Microbiologie pour l'Environnement (LCPME), Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS)-Institut de Chimie du CNRS (INC), Helmholtz-Zentrum Dresden-Rossendorf (HZDR) |
| Rok vydání: | 2017 |
| Předmět: |
Materials science
Oxynitride perovskite Inorganic chemistry Analytical chemistry Oxide 02 engineering and technology 010402 general chemistry 01 natural sciences symbols.namesake chemistry.chemical_compound Electrical resistivity and conductivity Sputtering Materials Chemistry [CHIM]Chemical Sciences Thin film ComputingMilieux_MISCELLANEOUS [PHYS]Physics [physics] Mechanical Engineering Electron energy loss spectroscopy Metals and Alloys Nitrogen doping 021001 nanoscience & nanotechnology 0104 chemical sciences Amorphous solid chemistry Mechanics of Materials symbols LaFeO Orthorhombic crystal system 0210 nano-technology Raman spectroscopy |
| Zdroj: | Journal of Alloys and Compounds Journal of Alloys and Compounds, Elsevier, 2017, 724, pp.74-83. ⟨10.1016/j.jallcom.2017.07.025⟩ |
| ISSN: | 0925-8388 |
| Popis: | This paper reports on the first study of the chemical, optical, and structural properties of lanthanum ferrite oxynitride thin films deposited by reactive magnetron sputtering. The thin films were deposited in an Ar/O 2/N 2 mixture as reactive plasma, from two elemental La and Fe targets, at a room and high temperature (25 and 800 °C). The films deposited at room temperature are amorphous and have been flash annealed to crystallize the perovskite. The oxynitride properties were investigated and compared to the oxide films deposited in Ar/O 2 gas mixture. All the oxide and oxynitride films present an orthorhombic structure. However, the nitrogen doping is limited to 1–1.5% and leads to the lattice expansion (4%), the bandgap narrowing, a lower electrical resistivity in range [25–350 °C], and a modification of Infrared and Raman spectra. Electron Energy Loss Spectroscopy measurements clearly show the presence of two nitrogen sites with an “active” intra-granular nitrogen associated to a variation of the physical properties. |
| Databáze: | OpenAIRE |
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