Upper and Lower Tight Error Bounds for Feature Omission with an Extension to Context Reduction

Autor: Eugen Beck, Ralf Schlüter, Hermann Ney
Jazyk: angličtina
Rok vydání: 2019
Předmět:
Zdroj: IEEE transactions on pattern analysis and machine intelligence : TPAMI 41(2), 502-514 (2019). doi:10.1109/TPAMI.2017.2788434
IEEE Transactions on Pattern Analysis and Machine Intelligence
DOI: 10.1109/TPAMI.2017.2788434
Popis: IEEE transactions on pattern analysis and machine intelligence : TPAMI 41(2), 502-514 (2019). doi:10.1109/TPAMI.2017.2788434
Published by IEEE, New York, NY
Databáze: OpenAIRE