Development of near-field emission limit from radiated-emission limit based on statistical approach
| Autor: | Tengiz Svimonishvili, Kye Yak See, Wei-Shan Soh, Wee-Jin Koh, Weng-Yew Chang, Manish Oswal, Lin Biao Wang, Ning Fang |
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| Přispěvatelé: | School of Electrical and Electronic Engineering, IEEE Electrical Design of Advanced Packaging and Systems Symposium (2012 : Taipei, Taiwan) |
| Rok vydání: | 2012 |
| Předmět: |
Electromagnetic field
Physics Conducted electromagnetic interference Engineering::Electrical and electronic engineering [DRNTU] Electromagnetic compatibility Electronic engineering Computational electromagnetics Field strength Near and far field Optical field Electromagnetic pulse Computational physics |
| Zdroj: | 2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium (EDAPS). |
| Popis: | This paper discusses a novel approach to transforming a radiated-emission limit (e.g., CISPR 22 and FCC) from the far-field to the near-field region. The proposed approach combines data from a near-field scanner and a gigahertz transverse electromagnetic cell with statistics to establish a simple relationship between a near-field magnetic field and a far-field electric field. It is shown that the proposed approach has the potential to be a simple, quick, and fairly inexpensive tool for electromagnetic compatibility pre-compliance purposes. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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