Roughness-induced domain structure in perpendicular Co/Ni multilayers
| Autor: | R. Schäfer, V. Neu, Manisha Arora, R. Thanhoffer, René Hübner, N. R. Lee-Hone, Dieter Suess, D. M. Broun, Erol Girt |
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| Jazyk: | angličtina |
| Rok vydání: | 2016 |
| Předmět: |
Materials science
Modulated surfaces FOS: Physical sciences 02 engineering and technology Surface finish 01 natural sciences Magnetization Nuclear magnetic resonance 0103 physical sciences Perpendicular Seed layer thickness In-plane magnetization Thin film 010302 applied physics Condensed Matter - Materials Science Condensed matter physics Materials Science (cond-mat.mtrl-sci) Coercivity 021001 nanoscience & nanotechnology Condensed Matter Physics Polar-Kerr Electronic Optical and Magnetic Materials Remanence Domain structure Domain density Magnetic force microscope 0210 nano-technology Layer (electronics) Micromagnetic simulations Varying thickness |
| Zdroj: | Journal of Magnetism and Magnetic Materials 441(2017), 283-289 |
| Popis: | We investigate the correlation between roughness, remanence and coercivity in Co/Ni films grown on Cu seed layers of varying thickness. Increasing the Cu seed layer thickness of Ta/Cu/8×[Co/Ni] thin films increases the roughness of the films. In-plane magnetization loops show that both the remanence and coercivity increase with increasing seed layer roughness. Polar Kerr microscopy and magnetic force microscopy reveal that the domain density also increases with roughness. Finite element micromagnetic simulations performed on structures with periodically modulated surfaces provide further insight. They confirm the connection between domain density and roughness, and identify the microsocpic structure of the domain walls as the source of the increased remanence in rough films. The simulations predict that the character of the domain walls changes from Bloch-like in smooth films to Neel-like for rougher films. |
| Databáze: | OpenAIRE |
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