Scanning speed phenomenon in contact-resonance atomic force microscopy
| Autor: | Ryan C. Tung, Jason P. Killgore, Christopher C. Glover |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
Quantitative imaging
Materials science General Physics and Astronomy 02 engineering and technology lcsh:Chemical technology 010402 general chemistry lcsh:Technology 01 natural sciences Full Research Paper Related phenomenon Optics contact resonance atomic force microscope phenomenon Nanotechnology lcsh:TP1-1185 General Materials Science liquid Electrical and Electronic Engineering lcsh:Science Spectroscopy lcsh:T business.industry Atomic force microscopy Work (physics) Resonance 021001 nanoscience & nanotechnology lcsh:QC1-999 0104 chemical sciences Characterization (materials science) Nanoscience lcsh:Q 0210 nano-technology business Hydrodynamic theory scan speed lcsh:Physics |
| Zdroj: | Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 945-952 (2018) Beilstein Journal of Nanotechnology |
| ISSN: | 2190-4286 |
| DOI: | 10.3762/bjnano.9.87 |
| Popis: | This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data. |
| Databáze: | OpenAIRE |
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