Nanostructured dielectric surfaces for Raman spectroscopy
| Autor: | Stoevelaar, L.P. (Pjotr), Černigoj, Jernej, Berzins, Jonas, Silvestri, F., Gerini, Giampiero, Engheta, Nader, Noginov, Mikhail A., Zheludev, Nikolay I. |
|---|---|
| Přispěvatelé: | Electromagnetics |
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Materials science
Silicon chemistry.chemical_element Physics::Optics Substrate (electronics) Dielectric law.invention chemistry.chemical_compound symbols.namesake law Thin film Field enhancement silicon dimers Field enhancement business.industry SERS Surface-enhanced Raman spectroscopy All dielectric metasurface Silicon nitride chemistry silicon dimers symbols Optoelectronics Waveguide business Raman spectroscopy |
| Zdroj: | Metamaterials, Metadevices, and Metasystems 2019 |
| ISSN: | 0277-786X |
| Popis: | In this paper, an all-dielectric metasurface for surface enhanced Raman spectroscopy (SERS) is presented. The proposed design constitutes of an array of silicon (Si) dimers on top of thin film of silicon nitride (SiN), deposited on a glass substrate. The coupling mechanism between the dimers is based on two orthogonal guided waves in the SiN film. These guided modes lead to a strong separation between excitation and emitted Raman signal in the waveguide. The new design is compared to a previously published dielectric design with a gold backing mirror. The comparison takes into account manufacturability, field enhancement and thermal aspects. This shows that the all-dielectric design has about seven times less power dissipation but the enhancement factor is about 20 times smaller. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|