Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4 250 eV
| Autor: | Andrey Sokolov, R. S. Pleshkov, Nikolay I. Chkhalo, M.G. Sertsu, Vladimir N. Polkovnikov, N. N. Tsybin, N. N. Salashchenko, Franz Schäfers, M. V. Svechnikov, Alexey Lopatin |
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| Rok vydání: | 2020 |
| Předmět: |
Nuclear and High Energy Physics
Radiation Materials science Synchrotron Radiation Source chemistry.chemical_element Large scale facilities for research with photons neutrons and ions 02 engineering and technology Photon energy 021001 nanoscience & nanotechnology 01 natural sciences Synchrotron law.invention 010309 optics chemistry Beamline law Attenuation coefficient 0103 physical sciences Transmittance Beryllium Atomic physics 0210 nano-technology Instrumentation Refractive index |
| Popis: | In this work, the refractive index of beryllium in the photon energy range 20.4–250 eV was experimentally determined. The initial data include measurements of the transmittance of two free-standing Be films with thicknesses of 70 nm and 152 nm, as well as reflectometric measurements of similar films on a substrate. Measurements were carried out at the optics beamline of the BESSY II synchrotron radiation source. The absorption coefficient β was found directly from the transmission coefficient of the films, and the real part of the polarizability δ was calculated from the Kramers–Kronig relations. A comparison is carried out with results obtained 20 years ago at the ALS synchrotron using a similar methodology. |
| Databáze: | OpenAIRE |
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