A Survey of Testing Techniques for Approximate Integrated Circuits
| Autor: | Alberto Bosio, Arnaud Virazel, Mario Barbareschi, Marcello Traiola, Patrick Girard |
|---|---|
| Přispěvatelé: | TEST (TEST), Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Università degli studi di Napoli Federico II, Traiola, M., Virazel, A., Girard, P., Barbareschi, M., Bosio, A. |
| Jazyk: | angličtina |
| Rok vydání: | 2020 |
| Předmět: |
Approximate computing
test pattern Computer science Computation 02 engineering and technology Integrated circuit robustness Automatic test pattern generation 01 natural sciences law.invention [SPI]Engineering Sciences [physics] production errors Robustness (computer science) law 0103 physical sciences approximate integrated circuits (AxICs) 0202 electrical engineering electronic engineering information engineering Approximate computing (AxC) Electrical and Electronic Engineering [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics robustne Design paradigm circuit faults AxA testing 010302 applied physics circuit fault Test procedures hardware test testing 020202 computer hardware & architecture Reliability engineering production error Measurement uncertainty approximation-aware (AxA) test methodology automatic test pattern generation (ATPG) |
| Zdroj: | Proceedings of the IEEE Proceedings of the IEEE, Institute of Electrical and Electronics Engineers, In press, ⟨10.1109/JPROC.2020.2999613⟩ |
| ISSN: | 0018-9219 1558-2256 |
| Popis: | International audience; Approximate computing (AxC) is increasingly emerging as a new design paradigm to produce more efficient computation systems by judiciously reducing the computation quality. In particular, AxC has been successfully applied to integrated circuits (ICs), in the last years. Hence, concerning the test of such new class of ICs, namely approximate ICs (AxICs), new challenges--as well as new opportunities--have emerged. In this survey, we provide a thorough analysis of issues related to test procedures for AxICs and review the state-of-the-art techniques to deal with them. We resort to an illustrative example having the twofold aim of: 1) guiding the reader through the AxIC testing challenges and 2) illustrating the existing solutions to correctly overcome them, while suitably taking advantage of opportunities coming from approximation. We analyze experimentally the most recent testing techniques for AxICs and highlight their mature aspects, as well as their shortcomings. Experimental outcomes show that the testing process for AxIC is not completely mature. Indeed, only under specific conditions existing testing procedures achieve good results. |
| Databáze: | OpenAIRE |
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