Chemical Vapor Deposition of Cobalt and Nickel Ferrite Thin Films:Investigation of Structure and Pseudocapacitive Properties
| Autor: | Zhongshan Li, Yujiao Li, Klaus Schierbaum, Michael Wark, Alfred Ludwig, Dennis Zywitzki, Daniel M. Baier, Dereje H. Taffa, Jan-Lucas Wree, Raoul Schaper, Detlef Rogalla, Anjana Devi, Engin Ciftyurek, Michael Meischein |
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| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Supercapacitor
Materials science supercapacitors Mechanical Engineering chemistry.chemical_element Chemical vapor deposition chemical vapor deposition Chemical engineering chemistry cobalt ferrite pseudocapacitors Mechanics of Materials Cobalt ferrite Pseudocapacitor Thin film nickel ferrite Cobalt Nickel ferrite |
| Zdroj: | Zywitzki, D, Schaper, R, Ciftyürek, E, Wree, J L, Taffa, D H, Baier, D M, Rogalla, D, Li, Y, Meischein, M, Ludwig, A, Li, Z, Schierbaum, K, Wark, M & Devi, A 2021, ' Chemical Vapor Deposition of Cobalt and Nickel Ferrite Thin Films : Investigation of Structure and Pseudocapacitive Properties ', Advanced Materials Interfaces, vol. 8, no. 20, 2100949 . https://doi.org/10.1002/admi.202100949 |
| Popis: | Transition metal ferrites, such as CoFe2O4 (CFO) and NiFe2O4 (NFO), have gained increasing attention as potential materials for supercapacitors. Since chemical vapor deposition (CVD) offers advantages like interface quality to the underlying substrates and the possibility for coverage of 3D substrates, two CVD processes are reported for CFO and NFO. Growth rates amount to 150 to 200 nm h−1 and yield uniform, dense, and phase pure spinel ferrite films according to X-ray diffraction (XRD), Raman spectroscopy, Rutherford backscattering spectrometry and nuclear reaction analysis (RBS/NRA) and scanning electron microscopy (SEM). Atom probe tomography (APT) and synchrotron X-ray photoelectron spectroscopy (XPS) give insights into the vertical homogeneity and oxidation states in the CFO films. Cation disorder of CFO is analyzed for the first time from synchrotron-based XPS. NFO is analyzed via lab-based XPS. Depositions on conducting Ni and Ti substrates result in electrodes with pseudocapacitive behavior, as evidenced by cyclovoltammetry (CV) experiments. The interfacial capacitances of the electrodes are up to 185 µF cm−2. |
| Databáze: | OpenAIRE |
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