A predictive bottom-up hierarchical approach to digital system reliability
| Autor: | V. Robert, Sylvain Engels, Philippe Flatresse, Florian Cacho, P. Mergault, Lorena Anghel, R. Delater, Vincent Huard, Damien Croain, E. Pion, N. Ruiz Amador |
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| Přispěvatelé: | STMicroelectronics [Crolles] (ST-CROLLES), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2012 |
| Předmět: |
010302 applied physics
Engineering Electrical aging business.industry 020208 electrical & electronic engineering 02 engineering and technology Top-down and bottom-up design integrated circuit reliability 01 natural sciences Life testing Reliability engineering Work (electrical) Logic gate PACS 85.42 0103 physical sciences logic gates 0202 electrical engineering electronic engineering information engineering System level timing System on a chip [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics business Reliability (statistics) |
| Zdroj: | Proc. of IEEE International Reliability Physics Symposium (IRPS'12) IEEE International Reliability Physics Symposium (IRPS'12) IEEE International Reliability Physics Symposium (IRPS'12), Apr 2012, Anaheim, CA, United States. pp.4B.1.1-4B.1.10, ⟨10.1109/IRPS.2012.6241830⟩ |
| DOI: | 10.1109/IRPS.2012.6241830⟩ |
| Popis: | ISBN 978-1-4577-1678-2; This paper has been granted the OUTSTANDING PAPER AWARD; International audience; This work has introduced a new electrical aging assessment framework for digital systems, based upon strong physics-based foundations and an adequate bottom-up approach which enables propagating accurate reliability knowledge at system level. This work opens new ways to optimize high level digital systems with respect to aging with great accuracy. |
| Databáze: | OpenAIRE |
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