Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations

Autor:	Tomasz Rajkowski, Frédéric Saigné, Pierre-Xiao Wang
Jazyk:	angličtina
Rok vydání:	2022
Předmět:	TK7800-8360 Computer Networks and Communications Hardware and Architecture Control and Systems Engineering system-level tests radiation hardness assurance total ionizing dose single event effects Signal Processing Electrical and Electronic Engineering Electronics
Zdroj:	Electronics, Vol 11, Iss 378, p 378 (2022) Electronics; Volume 11; Issue 3; Pages: 378
ISSN:	2079-9292
Popis:	System-level radiation testing of electronics is evaluated, based on test examples of the System-in-Package (SiP) module irradiations. Total ionizing dose and single event effects tests are analyzed to better understand the opportunities and limitations of the system-level approach in the context of the radiation qualification of electronics. Impact on the SiP product development is discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f12d6d0cb59307a5d4858cec7ac6afe6 https://www.mdpi.com/2079-9292/11/3/378 Zobrazit plný text záznamu