Phase plates in the transmission electron microscope: Operating principles and applications
| Autor: | Marco Beleggia, Misa Hayashida, Marek Malac, Simon Hettler, Emi Kano, Ray F. Egerton |
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| Přispěvatelé: | National Research Council of Canada |
| Jazyk: | angličtina |
| Rok vydání: | 2021 |
| Předmět: |
Materials science
Cryo-electron microscopy Physics::Instrumentation and Detectors Phase contrast microscopy Phase (waves) Inelastic scattering law.invention Physics::Fluid Dynamics Phase plate Radiation damage Optics Structural Biology law Electron beam-induced sample charging Radiology Nuclear Medicine and imaging Cryo electron microscopy Hole-free phase plate (HFPP) Sample contamination Volta phase plate (VPP) Volta plase plate (VPP) Instrumentation hole-free phase plate (HFPP) cryo electron microscopy business.industry electron beam-induced sample charging Transmission electron microscopy radiation damage sample contamination business Focus (optics) |
| Zdroj: | Zaguán: Repositorio Digital de la Universidad de Zaragoza Universidad de Zaragoza Digital.CSIC. Repositorio Institucional del CSIC instname Zaguán. Repositorio Digital de la Universidad de Zaragoza |
| Popis: | In this paper, we review the current state of phase plate imaging in a transmission electron microscope. We focus especially on the hole-free phase plate design, also referred to as the Volta phase plate. We discuss the implementation, operating principles and applications of phase plate imaging. We provide an imaging theory that accounts for inelastic scattering in both the sample and in the hole-free phase plate. Primary source of funding for this work was NRC-NANO research centre of National Research Council, Canada. |
| Databáze: | OpenAIRE |
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