Predicting the SEU Error Rate through Fault Injection for a Complex Microprocessor
| Autor: | Peronnard, P., Ecoffet, R., Pignol, M., Bellin, D., Velazco, R., Foucard, G. |
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| Přispěvatelé: | Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Centre National d'Études Spatiales [Toulouse] (CNES), E2V Semiconductors SAS [Saint-Egrève] (E2V), E2V, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS) |
| Jazyk: | angličtina |
| Rok vydání: | 2008 |
| Předmět: |
010308 nuclear & particles physics
Computer science business.industry 020208 electrical & electronic engineering Real-time computing Word error rate 02 engineering and technology Fault injection Hardware_PERFORMANCEANDRELIABILITY 01 natural sciences Power (physics) law.invention SEU-rate Microprocessor Logic synthesis Software fault-injection-tool law PACS 85.42 0103 physical sciences 0202 electrical engineering electronic engineering information engineering [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics business Field-programmable gate array Computer Science::Operating Systems |
| Zdroj: | Proc. of IEEE International Symposium on Industrial Electronics (ISIE'2008) IEEE International Symposium on Industrial Electronics (ISIE'2008) IEEE International Symposium on Industrial Electronics (ISIE'2008), Jun 2008, Cambridge, United Kingdom. pp.2288-2292, ⟨10.1109/ISIE.2008.4677290⟩ |
| DOI: | 10.1109/ISIE.2008.4677290⟩ |
| Popis: | ISBN : 978-1-4244-1665-3; International audience; This paper deals with the prediction of SEU error rate for an application running on a complex processor. Both, radiation ground testing and fault injection, were performed while the selected processor, a Power PC 7448, executed a software issued from a real space application. The predicted error rate shows that generally used strategies, based on static cross-section, significantly overestimate the application error rate. |
| Databáze: | OpenAIRE |
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