Fizeau interferometer-fringe sharpening

Autor: P. H. Langenbeck
Rok vydání: 2010
Předmět:
Zdroj: Applied optics. 9(9)
ISSN: 1559-128X
Popis: A vector representation of the formation of fringe profiles in a Fizeau (wedge) interferometer shows that, under certain conditions, off-axis illumination may lead to fringe sharpening. The incident angle is such that the beam is first reflected toward the apex of the wedge and, following a certain controllable number of reflections, is reflected away from the apex. A typical example is shown.
Databáze: OpenAIRE