ASTEP (2005-2015): Ten Years of Soft Error and Atmospheric Radiation Characterizations on the Plateau de Bure
| Autor: | Gilles Gasiot, T. Saad Saoud, S. Moindjie, Daniela Munteanu, S. Sauze, Jean-Luc Autran, Philippe Roche |
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| Přispěvatelé: | Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU), STMicroelectronics [Crolles] (ST-CROLLES), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Autran, Jean-Luc |
| Jazyk: | angličtina |
| Rok vydání: | 2015 |
| Předmět: |
Physics
Atmospheric radiation geography Plateau geography.geographical_feature_category [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Cosmic ray Condensed Matter Physics Geodesy 7. Clean energy Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials Altitude Soft error Radiation monitoring Electrical and Electronic Engineering [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics Safety Risk Reliability and Quality Simulation |
| Zdroj: | ESREF Conference ESREF Conference, Oct 2015, Toulouse, France Microelectronics Reliability Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1506-1511. ⟨10.1016/j.microrel.2015.06.101⟩ Microelectronics Reliability, 2015, 55 (9-10), pp.1506-1511. ⟨10.1016/j.microrel.2015.06.101⟩ |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/j.microrel.2015.06.101⟩ |
| Popis: | 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Toulouse, FRANCE, OCT 05-19, 2015; International audience; This paper surveys ten years of experimentation conducted on the Altitude SEE (Single Event Effects) Test European Platform (ASTEP), a permanent mountain laboratory opened in 2005 on the Plateau de Bure (Devoluy, France) at the altitude of 2552 m and primarily dedicated to the characterization of soft errors in electronic circuits subjected to terrestrial cosmic rays. The paper retraces the foundations of the project and gives an extensive overview of the different past, current and future experiments conducted on ASTEP in the fields of SER (soft error rate) real-time testing and natural radiation monitoring and metrology. (C) 2015 Elsevier Ltd. All rights reserved. |
| Databáze: | OpenAIRE |
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