Measurement of residual stresses in pulsed laser deposited thin films

Autor:	董恺琛 Dong Kai-chen, 吴军桥 Wu Jun-qiao, 姚杰 Yao Jie, 尤政 You Zheng, 娄帅 Lou Shuai
Předmět:	Pulsed laser Materials science Residual stress Thin film Composite material Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials
Zdroj:	ResearcherID
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ec744123c38bb59e6711efd0a2d098ce http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=CSCD&KeyUT=CSCD:6160488&KeyUID=CSCD:6160488 Zobrazit plný text záznamu