Optical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt
| Autor: | Pablo F. Siles, Manuel Monecke, Oliver G. Schmidt, Mario Ruben, Peter Richter, Peter Robaschik, Michael Fronk, Georgeta Salvan, Daniel Grimm, Svetlana Klyatskaya, Dietrich R. T. Zahn, Daniel Bülz |
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| Jazyk: | angličtina |
| Rok vydání: | 2014 |
| Předmět: |
Materials science
Analytical chemistry Aucun General Physics and Astronomy chemistry.chemical_element lcsh:Chemical technology Electron beam physical vapor deposition lcsh:Technology Full Research Paper chemistry.chemical_compound transport properties Ellipsometry Nanotechnology General Materials Science Electrical measurements lcsh:TP1-1185 Electrical and Electronic Engineering Thin film lcsh:Science current sensing AFM spintronics lcsh:T lcsh:QC1-999 Nanoscience Carbon film chemistry TbPc2 Phthalocyanine lcsh:Q Cobalt Layer (electronics) lcsh:Physics ellipsometry |
| Zdroj: | Beilstein Journal of Nanotechnology Beilstein Journal of Nanotechnology, Vol 5, Iss 1, Pp 2070-2078 (2014) |
| ISSN: | 2190-4286 |
| Popis: | The optical and electrical properties of terbium(III) bis(phthalocyanine) (TbPc2) films on cobalt substrates were studied using variable angle spectroscopic ellipsometry (VASE) and current sensing atomic force microscopy (cs-AFM). Thin films of TbPc2 with a thickness between 18 nm and 87 nm were prepared by organic molecular beam deposition onto a cobalt layer grown by electron beam evaporation. The molecular orientation of the molecules on the metallic film was estimated from the analysis of the spectroscopic ellipsometry data. A detailed analysis of the AFM topography shows that the TbPc2 films consist of islands which increase in size with the thickness of the organic film. Furthermore, the cs-AFM technique allows local variations of the organic film topography to be correlated with electrical transport properties. Local current mapping as well as local I–V spectroscopy shows that despite the granular structure of the films, the electrical transport is uniform through the organic films on the microscale. The AFM-based electrical measurements allow the local charge carrier mobility of the TbPc2 thin films to be quantified with nanoscale resolution. |
| Databáze: | OpenAIRE |
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