Beam emittance measurements on multicusp ion sources

Autor:	M. Sarstedt, Marc Weber, Y. Lee, D. S. Pickard, M. D. Williams, L. T. Perkins, Ka-Ngo Leung
Rok vydání:	1996
Předmět:	Materials science Ion beam business.industry Ion gun Ion beam lithography Accelerators and Storage Rings Ion source Ion Optics Physics::Plasma Physics Physics::Accelerator Physics Thermal emittance Laser beam quality Atomic physics Beam emittance business Instrumentation
Zdroj:	Review of Scientific Instruments. 67:1249-1251
ISSN:	1089-7623 0034-6748
DOI:	10.1063/1.1146688
Popis:	Multicusp ion sources are used for various applications. Presently, the implementation of this type of ion source is planned for the development of an ion beam lithography machine, which will be used for the projection of sub‐0.2 μm patterns onto a wafer substrate. Since, for this application, a very good beam quality and a small ion energy spread are required, emittance measurements have been performed on a multicusp ion source for various source conditions. It is shown that the installation of proper capacitors between the extraction electrodes is necessary to avoid rf pickup, which otherwise leads to a distortion of the beam emittance. The influence of the magnetic filter field on the beam emittance has been investigated, and the beam emittance of a dc filament‐discharge plasma has also been compared to that of a rf‐generated plasma.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e90e012b443700294653c1c968876704 https://doi.org/10.1063/1.1146688 Zobrazit plný text záznamu