Experimental analysis of waveguide-coupled surface-plasmon-polariton cone properties
| Autor: | Emily A. Smith, Stephen C. Weibel, Charles K. A. Nyamekye, Andrew C. Hillier, Russell Mahmood, Qiaochu Zhu |
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| Rok vydání: | 2018 |
| Předmět: |
Waveguide (electromagnetism)
Total internal reflection business.industry Chemistry 010401 analytical chemistry Physics::Optics 02 engineering and technology 021001 nanoscience & nanotechnology Polarization (waves) 01 natural sciences Biochemistry Surface plasmon polariton Ray 0104 chemical sciences Analytical Chemistry symbols.namesake Wavelength Optics symbols Environmental Chemistry 0210 nano-technology business Refractive index Spectroscopy Raman scattering |
| Zdroj: | Analytica chimica acta. 1048 |
| ISSN: | 1873-4324 |
| Popis: | Experimental data for waveguide-coupled surface-plasmon-polariton (SPP) cones generated from dielectric waveguides is presented. The results demonstrate a simpler route to collect plasmon waveguide resonance (i.e., PWR) data. In the reverse-Kretschmann configuration (illumination from the sample side) and Kretschmann configuration (illumination from the prism side), all the waveguide modes are excited simultaneously with p- or s-polarized incident light, which permits rapid acquisition of PWR data without the need to scan the incident angle or wavelength, in the former configuration. The concentric SPP cone properties depend on the thickness and index of refraction of the waveguide. The angular intensity pattern of the cone is well-matched to simulation results in the reverse-Kretschmann configuration, and is found to be dependent on the polarization of the incident light and the polarization of the waveguide mode. In the Kretschmann geometry, all waveguide-coupled SPP cones are measured at incident angles that produce attenuated light reflectivity. In addition, the enhanced electric field produced under total internal reflection allows high signal-to-noise ratio multimodal spectroscopies (e.g., Raman scattering, luminescence) to measure the chemical content of the waveguide film, which traditionally is not measured with PWR. |
| Databáze: | OpenAIRE |
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