High-resolution surface chemical analysis of a trifunctional pattern made by sequential colloidal shadowing
| Autor: | Folmer Lyckegaard, Peter Kingshott, Ryosuke Ogaki |
|---|---|
| Rok vydání: | 2010 |
| Předmět: |
Plasma etching
Silanes Surface Properties Photoelectron Spectroscopy Analytical chemistry Substrate (chemistry) Spectrometry Mass Secondary Ion Atomic and Molecular Physics and Optics Secondary ion mass spectrometry chemistry.chemical_compound chemistry X-ray photoelectron spectroscopy Chemical engineering Particle Self-assembly Colloids Gold Sulfhydryl Compounds Physical and Theoretical Chemistry Particle Size Layer (electronics) |
| Zdroj: | Kingshott, P, Lyckegaard, F & Ogaki, R 2010, ' High-Resolution Surface Chemical Analysis of a Trifunctional Pattern Made by Sequential Colloidal Shadowing ', ChemPhysChem, vol. 11, no. 17, pp. 3609-3616 . https://doi.org/10.1002/cphc.201000737 |
| ISSN: | 1439-7641 |
| DOI: | 10.1002/cphc.201000737 |
| Popis: | We present a new method for creating surface chemical patterns where three chemistries can be periodically arranged at alternate positions on a single substrate without the use of top-down approaches. High-resolution chemical imaging by time-of-flight secondary ion mass spectrometry (ToF-SIMS), with nanometer spatial resolution, is used to prove the success of the patterning and subsequent chemical modification steps. We use a combination of colloidal self-assembly, plasma etching, self-assembled monolayers (SAMs) and physical vapour deposition (PVD). The method utilizes a double colloid assembly process in which a first layer of close-packed colloids is created, followed by plasma etching, coating with gold and deposition of a first SAM layer. A second particle layer is deposited on top of the first layer masking the interstitial spaces containing the first SAM. A second gold layer is deposited followed by a second SAM. After particle removal the surface consists of the pattern containing two different SAMs and a SiO 2 layer that can be readily functionalized with silanes. The possibility in the replacement of the two different thiols is investigated by X-ray photoelectron spectroscopy (XPS) and it was found that no replacement is taking place. ToF-SIMS imaging is used to show the periodicity of the chemical patterns by tracking unique fragment ions from the different surface regions. The patterning method is adaptable to create smaller or larger chemical patterns by appropriate choice of particle sizes. The patterns are useful for immobilizing biomolecules for cell studies or as multiplexed biosensors. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Plný text