Porosimetry for thin films of Metal–Organic Frameworks: a comparison of Positron Annihilation Lifetime Spectroscopy and Adsorption‐Based Methods
Autor: | Ivo F.J. Vankelecom, Rob Ameloot, Matthias Thommes, Marcel Dickmann, Alexander John Cruz, Rhea Verbeke, Dirk De Vos, Werner Egger, João Marreiros, Mikhail Krishtab, Timothée Stassin, David Grosso, Shuhei Furukawa, Ivo Stassen, Sabina Rodríguez-Hermida |
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Přispěvatelé: | Materials and Chemistry, Faculty of Engineering, Faculty of Arts and Philosophy |
Rok vydání: | 2023 |
Předmět: |
positron annihilation lifetime spectroscopy
Materials science 02 engineering and technology 010402 general chemistry 01 natural sciences Crystallinity metal–organic frameworks Adsorption Physisorption Materials Science(all) Specific surface area General Materials Science Thin film metal-organic frameworks Mechanical Engineering Porous Materials porosimetry Quartz crystal microbalance Porosimetry 021001 nanoscience & nanotechnology 0104 chemical sciences Chemical engineering thin films adsorption Mechanics of Materials Metal-organic framework 0210 nano-technology porous materials |
Zdroj: | Advanced Materials |
DOI: | 10.6084/m9.figshare.22133267.v1 |
Popis: | Thin films of crystalline and porous metal-organic frameworks (MOFs) have great potential in membranes, sensors, and microelectronic chips. While the morphology and crystallinity of MOF films can be evaluated using widely available techniques, characterizing their pore size, pore volume, and specific surface area is challenging due to the low amount of material and substrate effects. Positron annihilation lifetime spectroscopy (PALS) is introduced as a powerful method to obtain pore size information and depth profiling in MOF films. The complementarity of this approach to established physisorption-based methods such as quartz crystal microbalance (QCM) gravimetry, ellipsometric porosimetry (EP), and Kr physisorption (KrP) is illustrated. This comprehensive discussion on MOF thin film porosimetry is supported by experimental data for thin films of ZIF-8. ispartof: ADVANCED MATERIALS vol:33 issue:17 ispartof: location:Germany status: published |
Databáze: | OpenAIRE |
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