Processing of double-sided interferograms subject to background self-radiation of an FTIR spectrometer
| Autor: | S. E. Tabalin, V. N. Kornienko, S. I. Svetlichnyi, V. A. Pozdnyakov, S. K. Dvoruk, I. V. Kochikov, M. V. Lel’kov, Andrey N. Morozov |
|---|---|
| Rok vydání: | 2002 |
| Předmět: |
Physics
Infrared business.industry Astrophysics::Instrumentation and Methods for Astrophysics Radiation Laser Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials law.invention Interferometry symbols.namesake Optics Fourier transform law Brightness temperature symbols Fourier transform infrared spectroscopy Photonics business |
| Zdroj: | ResearcherID |
| ISSN: | 1562-6911 0030-400X |
| DOI: | 10.1134/1.1531725 |
| Popis: | The effect of background (instrumental) self-radiation of a Fourier transform infrared (FTIR) spec- trometer on the processing of double-sided interferograms is studied. From a theoretical analysis of the Mich- elson interferometer it was shown that when the brightness temperature of the object of study is close to the temperature of the instrument, the measured spectrum may contain inverted spectral ranges or isolated bands. The interferogram correction algorithms and experimental technique for elimination of the spectrum inversion and for compensation of the background self-radiation of the instrument are suggested. © 2002 MAIK "Nauka/Interperiodica". |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|