Microstructure Design for Fast Lifetime Measurements of Magnetic Tunneling Junctions
| Autor: | Ronald Lehndorff, Andrés Conca Parra, Mathias Kläui, Frederick Casper, Burkard Hillebrands, Christian Haupt, Johannes Paul, Gerhard Jakob |
|---|---|
| Jazyk: | angličtina |
| Rok vydání: | 2019 |
| Předmět: |
Materials science
530 Physics Population MgO 02 engineering and technology lcsh:Chemical technology 01 natural sciences Biochemistry Article Analytical Chemistry tunneling barrier stress Critical point (thermodynamics) sensor 0103 physical sciences Electronic engineering lcsh:TP1-1185 Electrical and Electronic Engineering education Instrumentation Weibull distribution 010302 applied physics education.field_of_study reliability Time evolution Failure rate 021001 nanoscience & nanotechnology Microstructure 530 Physik Atomic and Molecular Physics and Optics Magnetic field failure Distribution function TMR Weibull 0210 nano-technology MTJ |
| Zdroj: | Sensors (Basel, Switzerland) Sensors Volume 19 Issue 3 Sensors, Vol 19, Iss 3, p 583 (2019) |
| ISSN: | 1424-8220 |
| Popis: | The estimation of the reliability of magnetic field sensors against failure is a critical point concerning their application for industrial purposes. Due to the physical stochastic nature of the failure events, this can only be done by means of a statistical approach which is extremely time consuming and prevents a continuous observation of the production. Here, we present a novel microstructure design for a parallel measurement of the lifetime characteristics of a sensor population. By making use of two alternative designs and the Weibull statistical distribution function, we are able to measure the lifetime characteristics of a CoFeB/MgO/CoFeB tunneling junction population. The main parameters governing the time evolution of the failure rate are estimated and discussed and the suitability of the microstructure for highly reliable sensor application is proven. |
| Databáze: | OpenAIRE |
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